Electromigration in thin films and electronic devices: Materials and reliability
Kim, Ki Hang
Electromigration in thin films and electronic devices: Materials and reliability - Oxford Woodhouse Publishing 2011 - xii, 340 p.
2686 21/03/2017 IBS17/741 21/03/2017 Main Budget
USD255
621.38152 K56E
Electromigration in thin films and electronic devices: Materials and reliability - Oxford Woodhouse Publishing 2011 - xii, 340 p.
2686 21/03/2017 IBS17/741 21/03/2017 Main Budget
USD255
621.38152 K56E