Point defects in semiconductors II: experimental aspect (Record no. 36452)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00403nam a2200157Ia 4500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 230917s9999||||xx |||||||||||||| ||und|| |
| 020 ## - ISBN | |
| Price | DM82 |
| 040 ## - CATALOGING SOURCE | |
| -- | 17725 |
| Original cataloging agency | VIVEKANANDA LIBRARY |
| 041 ## - Language | |
| -- | English |
| 082 ## - DDC NUMBER | |
| Classification number | 537.622 L284P |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Bourgoin, J |
| 245 #0 - TITLE STATEMENT | |
| Title | Point defects in semiconductors II: experimental aspect |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication, distribution, etc | Berlin |
| Name of publisher, distributor, etc | Springer-Verlag |
| Date of publication, distribution, etc | 1983 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Pages | xvi,295 p. |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | Books |
| Withdrawn status | Lost status | Damaged status | Not for loan | Location (home branch) | Sublocation or collection (holding branch) | Date acquired | Koha issues (times borrowed) | Koha full call number | Accession No. | Koha date last seen | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|
| VIVEKANANDA LIBRARY | VIVEKANANDA LIBRARY | 08/08/2002 | 537.622 L284P | 101892 | 17/09/2023 | Books |