Electromigration in thin films and electronic devices: Materials and reliability
Language: English Publication details: Oxford Woodhouse Publishing 2011Description: xii, 340 pDDC classification:- 621.38152 K56E
| Item type | Current library | Call number | Materials specified | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|
| Books | VIVEKANANDA LIBRARY UIET Library | 621.38152 K56E (Browse shelf(Opens below)) | Available | 365708 |
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| 621.38152 C 152 S Science and engineering of microelectronic fabrication | 621.38152 C 152 S Science and engineering of microelectronic fabrication | 621.38152 C 152 S Science and engineering of microelectronic fabrication | 621.38152 K56E Electromigration in thin films and electronic devices: Materials and reliability | 621.38152 P615S Semiconductor device fundamentals | 621.38152 P615S Semiconductor device fundamentals | 621.38152 P615S Semiconductor device fundamentals |
2686 21/03/2017 IBS17/741 21/03/2017 Main Budget
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