TY  - BOOK
AU  - Kim, Ki Hang
TI  - Electromigration in thin films and electronic devices: Materials and reliability
U1  - 621.38152 K56E 
PY  - 2011///
CY  - Oxford
PB  - Woodhouse Publishing
N1  - 2686 21/03/2017 IBS17/741 21/03/2017 Main Budget
ER  -