TY  - BOOK
AU  - Jens Lienig, Matthias Thiele
TI  - Fundamentals of Electromigration-Aware Integrated Circuit Design
SN  - 978-3-319-73558-0
PY  - 2018///
PB  - Springer International Publishing
UR  - https://doi.org/10.1007/978-3-319-73558-0
UR  - https://link.springer.com/openurl?genre=book&isbn=978-3-319-73558-0
ER  -