TY  - BOOK
AU  - Reifenberger, Ronald
TI  - Fundamentals of atomic force microscopy: Part1-Foundations
U1  - 502.82 R272F 
PY  - 2016///
CY  - Singapore
PB  - World Scientific Publishing
N1  - 3018 24/01/2018 RBP18/69414 09/03/2018 Main Budget
ER  -