TY  - BOOK
AU  - Qiang Cui, Juin J. Liou, Jean-Jacques Hajjar, Javier Salcedo, Yuanzhong Zhou, Parthasarathy Srivatsan
TI  - On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits
SN  - 978-3-319-10819-3
PY  - 2015///
PB  - Springer International Publishing
UR  - https://doi.org/10.1007/978-3-319-10819-3
UR  - https://link.springer.com/openurl?genre=book&isbn=978-3-319-10819-3
ER  -