Defect analysis in electron microscopy
Language: English Publication details: London Chapman and Hall 1975Description: ix,134 pDDC classification:- 548.84 L82D
Item type | Current library | Call number | Materials specified | Status | Date due | Barcode | |
---|---|---|---|---|---|---|---|
Books | VIVEKANANDA LIBRARY | 548.84 L82D (Browse shelf(Opens below)) | Available | 103808 |
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