Fundamentals of atomic force microscopy: Part1-Foundations

By: Language: English Publication details: Singapore World Scientific Publishing 2016Description: xv, 324 pDDC classification:
  • 502.82 R272F
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Item type Current library Call number Materials specified Status Date due Barcode
Books VIVEKANANDA LIBRARY 502.82 R272F (Browse shelf(Opens below)) Available 369119

3018 24/01/2018 RBP18/69414 09/03/2018 Main Budget

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