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040 _e210497
_aMAIN
041 _aEnglish
082 _a620.5 L468F
100 _aLeach, Richard K
245 0 _aFundamental principles of engineering nanometrology
260 _aAmsterdam
_bElsevier
_c2010
300 _axxvi, 321p p.
942 _cBK
999 _c176663
_d176663