000 00366nam a2200145Ia 4500
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040 _e64671
_aMAIN
041 _aEnglish
082 _a530.4 T364M
100 _aThomas, J P, ed
245 0 _aMaterial characterization using ion beams
260 _aLondon
_bPlenum
_c1978
300 _axviii, 517 p.
942 _cBK
999 _c196769
_d196769