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020 _cDM82
040 _e17725
_aMAIN
041 _aEnglish
082 _a537.622 L284P
100 _aBourgoin, J
245 0 _aPoint defects in semiconductors II: experimental aspect
260 _aBerlin
_bSpringer-Verlag
_c1983
300 _axvi,295 p.
942 _cBK
999 _c36452
_d36452